q=Scanning+Electron+Microscopy%2C+Inc.%2C&searchType=standard&isFacet=true&view=standard&searchWay=publisher&rows=10&sortWay=score&sortOrder=desc&searchWay0=marc&logical0=AND
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Scanning Electron Microscopy, Inc.,
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albrecht, r. m
(4)
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johari, om
(3)
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becker, robert p
(2)
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edited by robert p. becker and om johari
(2)
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guest editors, r.m. albrecht [et al.]
(2)
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mestres, p
(2)
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stumpf, walter e
(2)
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bhatt, sudha a
(1)
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edited by ashutosh tiwari, mohammad rabia alenezi and seong chan jun
(1)
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edited by j. kirschner, k. murata, j.a. venables; managing editor: sudha a. bhatt
(1)
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kirschner, j
(1)
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murata, k
(1)
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pfefferkorn conference
(1)
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scanning electron microscopy symposium
(1)
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scanning electron microscopy, inc
(1)
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tiwari, ashutosh,
(1)
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venables, j. a
(1)
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